Equipment by Keywords
Click on keyword to expand or minimize the panels below. To reserve equipment time, or to view more information about an equipment, click on the equipment name. Visit the Equipment Rates page for our equipment rate schedule.
Display by:
Show:
- +3D Printing
- +Dicing/Bonding
- -Electron Microscopy/Microanalysis
- +Film Deposition
- +Hot Processing
- +Metrology
- +Other Analytical Techniques
- +Particle Analysis/Characterization
- +Photolithography
- +Plasma
- +Porosimetry/Porometry/Surface Area
- +Powder Mechanics
- +Sample Preparation
- +Spectroscopy
- +Surface Analysis/Characterization
- +Wet Processing
- +X-Ray Analysis/Characterization
- +Other (No Associated Keywords)
| Cameca SX Five FE EPMA | Status: Available |
| EDAX EDS/EBSD on FEI Helios NanoLab 600i dual beam | Status: Available |
| FIB/SEM - FEI Helios G4 PFIB CXe dual beam | Status: Available |
| FIB/SEM - FEI Helios NanoLab 600i dual beam | Status: Available |
| S/TEM - FEI Talos F200i | Status: Available |
| S/TEM - FEI Tecnai F20 | Status: Available |
| S/TEM - FEI Themis Z | Status: Available |
| SEM - FEI Nova 430 w/EDS & CL | Status: Available |
| SEM - Hitachi S-3000 | Status: Available |
| SEM - Tescan MIRA3 | Status: Available |