SEM - Tescan MIRA3 - Status: Available

• General Information
• Prerequisites
• Calendar
• Training
• Contacts
• Documents

General Information

Current Status:

Available

Use Rates:

External Academic & Government:

$95.80/Hour

External Affiliated Commercial/Industrial:

$162.20/Hour

External Commercial/Industrial:

$216.30/Hour

External International Academic:

$127.70/Hour

Internal Standard:

$63.90/Hour

Service:

Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.

Building:

NANO (0070)

Room:

EPMA Lab (285)

In Cleanroom:

No

Main Contact:

Nicholas Rudawski

Description

*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

Rate Notes: Published rates are for first 8 hours. Rate then decreases to $16/hr. for Internal Standard - $23.95/hr. for External Academic & Gov. - $31.90/hr. for External Int. Academic - $47.90/hr. for External Affiliated Commercial/Industrial - $63.85/hr. for External Commercial/Industrial.

Runs not to exceed 24 hours in total.

The Tescan MIRA3 scanning electron microscope rasters a focused energetic beam (probe) of electrons across a specimen surface. The interactions of the beam with the specimen are detected and then recorded as a function of probe position and used to generate two-dimensional images of the specimen. The signals that can be detected include secondary and backscattered electrons (for imaging), X-rays (for chemical analysis), and electron backscattered diffraction patterns (for structural analysis).

Instrument Specifications:


• Schottky field emission gun; 0.3 - 30 kV operating voltage
• Everhart-Thornley and dedicated backscattered electron detectors; SE+BSE or BSE only imaging
• EDAX Octane Pro (10 mm squared active area) SDD EDS
• EDAX Hikari Plus CCD EBSD camera. FOR USE OF THE EBSD FOR MORE THAN 8 HOURS, PLEASE CONTACT THE NRF FOR LONG RUNS RATES
• EDAX OIM Analysis 8 software



TRAINING REQUIREMENTS: Course EMA 6507 or Discussing with staff the content of the following reading material: Goldstein, J.I., Newbury, D.E., Echlin. P., Joy, D.C., Romig, A.D. Jr., Lyman, C.E., Fiori,C., and Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, A Text for Biologists, Materials Scientists, and Geologists. Third Edition. 2003. ISBN 0-306-47292-9 Chapters 2, 3 and 5. You will be directed to a quiz sign up link when requesting training for any of the SEM's.

Capabilities

• ~1 nm resolution SEM imaging
• Nanoscale compositional analysis using EDS
• Texture and crystallographic analysis using EBSD