Open House 2024 Weekly Update
NRF User of the Month - Enrique Sanchez, August 2024 - In appreciation of being an exemplary user with outstanding compliance to safety protocols and engagement with NRF staff and users to create a better safety culture.
SEMS 2021 - Robert Simmons Micrograph Competition - Best Photonic Micrograph - Gary Scheiffele - RSC UF - Title: Oh it's not a peanut
Atomic Resolution STEM Workshop by Nick Rudawski, watch on YouTube https://www.youtube.com/watch?v=7LwJLAZqHmk
Example photos from poster

Effect of Strontium and Calcium Concentration on Microstructure and in Vitro Degradation Rate

Poster by David Christianson, Hunter Henderson, Alex Heid, Michele V. Manuel, UF Materials Science & Engineering Department

View Poster
Example photos from poster

Fabrication of Large-Scale 50 nm Nanopore Arrays on Polytetrafluoethylene

Poster by Sarathy K. Gopalakrishnan, Matthias Trujillo, Kirk Ziegler, UF Materials Science & Engineering Department, Department of Chemical Engineering

View Poster
Example photos from poster

Development of a Passive Magnetic Field Sensor Utilizing Magnetoelectric Nanowires

Poster by Matthew J. Bauer, Xiao Wen, David P. Arnold, Jennifer S. Andrew, UF Materials Science & Engineering Department, Department of Electrical & Computer Engineering, MIST Center

View Poster
Example photos from poster

Design and Characterization of NiTiHfAl Precipitation Strengthened SMA

Poster by Flavia C. Gallo, Hunter B. Henderson, Nicholas Rudawski, Michael S. Kesler, Michele V. Manuel UF Materials Science & Engineering Department, Department of Chemical Engineering

View Poster
Example photos from poster

Interspecific Variation in the Bony Labyrinth (Inner Ear) of Anurans

Poster by Amber L. Singh, Lauren A. Gonzales, Daniel J. Paluh, David Blackburn UF Florida Museum of Natural History: Department of Herpeteology

View Poster
Example photos from poster

Atomic Layer Deposition of UltraThin Ferroelectric Materials

Poster by Glen Walters, Toshikazu Nishida, UF Department of Electrical & Computer Engineering

View Poster
Example photos from poster

Localized Release of Corticosteroid from Macroporous Organosilicone Beads Scaffolds

Poster by Jiapu Liang, Kaiyuan Jiang, Cherie Stable, UF J. Crayton Pruitt Family Department of Biomedical Engineering

View Poster
Example photos from poster

The Fin Bulk Acoustic Resonators (FinBAR): Enabling Integrated Signal Processing for 5G

Poster by Sayur Ghatge, Roozbeh Tabrizian, UF Department of Electrical & Computer Engineering

View Poster
Example photos from poster

Interaction of Cancer Cells with Microposts in a Microfluidic Device Immobilized with Aptamers

Poster by Kangfu Chen, Teodor Georgiev, Z. Hugh Fan, UF Mechanical & Aerospace Engineering Department, J. Crayton Pruitt Family Department of Biomedical Engineering, Department of Chemistry

View Poster
CT scans of a piraƱha, a Mexican beaded lizard, and an iodine-injected frog

New 3D Scanning Campaign

$2.5 million in National Science Foundation funding for "Open Exploration of Vertebrate Diversity in 3D."

READ MORE
Six 2D Materials Processing example images

2D Materials Processing

MoS2 random micro flakes over a SiO2 substrate were mapped and then precisely patterned for transmission line measurements.

READ MORE
Spiral Mirror Lens on Flat and Curved Surfaces

Spiral Mirror Lens on Flat and Curved Surfaces

A spiral designed lens was fabricated on both flat and curved surfaces.

READ MORE
High Electron Mobility Transistor (HEMT) device - layout (left), die in process (right)

AlGaN/GaN High Electron Mobility Transistor (HEMT)

The field of III-N semiconductors has gained a lot of attention for use in high speed and high power switching as well as solid-state sensors.

READ MORE
Micro Molds for PDMS Stamps

Micro Molds for PDMS Stamps

A variety of molds for polydimethylsiloxane (PDMS) casting were created in silicon (Si) wafers.

READ MORE
Solid-State Sensors

Solid-State Sensors

Solid-state sensors are advancing rapidly and are being placed in a wide array of applications from mechanical movement (accelerometers), sounds (microphones), and bio detection (glucose, pathogen).

READ MORE
Photo of a lizard, a CT-Scan image of lizard, a photo of a 3D printed lizard from CT-Scan

Nano-CT & 3D Printer

Specimens were scanned with a GE V|tome|xm 240 CT Scanner to obtain high resolution 3D images of the entire specimen.

READ MORE

Nanoscale Research Facility (NRF)

The Herbert Wertheim College of Engineering's Nanoscale Research Facility (NRF) support and enhance the research, education, and public service missions of the University of Florida by providing access to characterization and process instrumentation. Expert staff provides the assistance and guidance necessary so that students, faculty, and industry get the most effective and appropriate use of facility resources.Read More >

News & Announcements

Microscopy & Microanalysis 2024 Presentations Posted on Tue, Jul 23, 2024 at 4:50 PM

 

Correlated Multi-Scale Characterization of Crystals in a Conductive Polymer

Research service facilities are routinely challenged with requests to analyze various materials, including some with unknown components and structures. With a wide range of instrumentation and analytical techniques, information can be obtained with complementary characterization modalities and across different measurement scales.

One case that required this multimodality, multi-scale characterization approach came from a user working on cyclic polyacetylene conductive polymer films. During a scanning electron microscopy (SEM) session, it was noticed that the samples had unexpected micron-scale crystals that needed to be identified. It was important to verify if the crystals were remnants from the catalyst synthesizing the polymer.

Integration of Transformational Capabilities in Research Service Center Facilities

X-ray tomography is a significant component of a unique group of instruments and techniques at the RSC supporting research requiring tomography and 3D imaging x-ray tomography (CT), diffraction contrast tomography (DCT), electron tomography, scanning electron photogrammetry, focused ion beam (FIB) slice and view, plasma FIB slice and view, Raman tomography, and optical profilometry. Incorporating a new imaging and analysis technique into the RSC facilities proved to be a worthy challenge, allowing the support of a new research community, expanding the center's activities, enabling cross-disciplinary research efforts, and expanding the center's visibility.

New State-of-the-Art Instrumentation Posted on Mon, Jan 13, 2020 at 4:58 PM

Image of the Helios G4 Instrument

The Helios G4 Plasma Focused Ion Beam CXe Workstation is a fourth generation, fully digital, Extreme High Resolution Field Emission Scanning Electron Microscope (FE SEM) equipped with an inductively coupled plasma (ICP) focused ion beam (PFIB).

Image of the Talos F200i Instrument

The Talos F200i S/TEM is a flexible and compact 200 kV FEG Scanning Transmission Electron Microscope (S/TEM), which is designed for fast, precise and quantitative characterization of nanomaterials.

Image of the 300kV Themis Z Instrument

The 300 kV Themis Z is a FEG Scanning Transmission Electron Microscope (S/TEM) with a high-tension voltage range of 60-300 kV.

The Research Service Centers in the Herbert Wertheim College of Engineering are the new home to three state-of-the-art, high-resolution electron microscopes.

The microscopes will provide support and enhance the research, education and public service missions of the University of Florida by providing access to characterization and process instrumentation and facilities. With expert staff on hand to provide assistance and guidance, the students, faculty and industry researchers who use these facilities are ensured the most effective and appropriate use of the center's capabilities.

All of the equipment is scheduled to be available for use and training in Spring of 2020. Announcements on utilization, service and training will be sent to the UF research community upon achieving the installation milestones necessary to start accepting users.

See All News >