Characterization Equipment by Keywords
To reserve equipment time, or to view more information about an equipment, click on the equipment name. Visit the Equipment Rates page for our equipment rate schedule.
| Keyword | Name | Status |
|---|---|---|
| Electron Microscopy/Microanalysis | Cameca SX Five FE EPMA | Available |
| Electron Microscopy/Microanalysis | EDAX EDS/EBSD on FEI Helios NanoLab 600i dual beam | Available |
| Electron Microscopy/Microanalysis | FIB/SEM - FEI Helios G4 PFIB CXe dual beam | In Use |
| Electron Microscopy/Microanalysis | FIB/SEM - FEI Helios NanoLab 600i dual beam | Available |
| Electron Microscopy/Microanalysis | FIB/SEM - Thermo Fisher Scios 2 dual beam | In Use |
| Electron Microscopy/Microanalysis | S/TEM - FEI Talos F200i | Available |
| Electron Microscopy/Microanalysis | S/TEM - FEI Tecnai F20 | Down |
| Electron Microscopy/Microanalysis | S/TEM - FEI Themis Z | Down |
| Electron Microscopy/Microanalysis | SEM - FEI Nova 430 w/EDS & CL | In Use |
| Electron Microscopy/Microanalysis | SEM - Hitachi S-3000 | Down |
| Electron Microscopy/Microanalysis | SEM - Tescan MIRA3 | In Use |
| Metrology | Bruker Optical Profilometer | Available |
| Metrology | Ellipsometer, J.A. Woolam | Available |
| Metrology | Horiba microRaman | In Use |
| Metrology | Profilometer, Tencor AS500 | Available |
| Metrology | Zeiss Microscope | Available |
| Other Analytical Techniques | Rheometer - ARES LS1 | Available |
| Particle Analysis/Characterization | Coulter LS13320 | Available |
| Particle Analysis/Characterization | Malvern Zetasizer Ultra | In Use |
| Particle Analysis/Characterization | TSI PSD 3603 (Aerosizer) | Down |
| Porosimetry/Porometry/Surface Area | Autosorb iQ - Analysis (Ar, CO2, He) | In Use |
| Porosimetry/Porometry/Surface Area | Autosorb iQ - Krypton | Available |
| Porosimetry/Porometry/Surface Area | Autosorb iQ - Outgassing (monitor) | In Use |
| Porosimetry/Porometry/Surface Area | Quantachrome PoreMaster Mercury Porosimeter | Available |
| Porosimetry/Porometry/Surface Area | Quantachrome Porometer 3g zh | Available |
| Sample Preparation | Coater - Carbon | In Use |
| Sample Preparation | Coater - Hummer V Au-Pd | Available |
| Sample Preparation | Coater - SPI Au-Pd | Available |
| Sample Preparation | Labconco Triad Freeze Dryer | Available |
| Spectroscopy | FTIR/FTIR Microscope - ThermoFisher iS50 | Available |
| Spectroscopy | Horiba microRaman | In Use |
| Spectroscopy | SEM - FEI Nova 430 w/EDS & CL | In Use |
| Spectroscopy | UV/Vis - Perkin-Elmer Lambda 800 | Available |
| Surface Analysis/Characterization | Bruker Optical Profilometer | Available |
| Surface Analysis/Characterization | Ellipsometer, J.A. Woolam | Available |
| Surface Analysis/Characterization | Perkin-Elmer PHI 660 - AES | Available |
| Surface Analysis/Characterization | SPM/AFM Dimension 3100 | Available |
| Surface Analysis/Characterization | XPS - ULVAC-PHI XPS | Available |
| X-Ray Analysis/Characterization | Amira - Tomography Software | Up |
| X-Ray Analysis/Characterization | Nano-CT - GE v|tome|x m 240 | Available |
| X-Ray Analysis/Characterization | Nano-CT Image Processing/Reconstruction System | Available |
| X-Ray Analysis/Characterization | Panalytical XPert MRD | In Use |
| X-Ray Analysis/Characterization | Panalytical XPert Powder | In Use |
| X-Ray Analysis/Characterization | Versa software workstation | Down |
| X-Ray Analysis/Characterization | Xnovo software workstation | In Use |
| X-Ray Analysis/Characterization | XRD Software Workstation | Available |
| X-Ray Analysis/Characterization | ZEISS Versa 620 XRM | In Use |
