Equipment by Keywords
Click on keyword to expand or minimize the panels below. To reserve equipment time, or to view more information about an equipment, click on the equipment name. Visit the Equipment Rates page for our equipment rate schedule.
Display by:
Show:
- +3D Printing
- +Dicing/Bonding
- +Electron Microscopy/Microanalysis
- +Film Deposition
- +Hot Processing
- -Metrology
- +Other Analytical Techniques
- +Particle Analysis/Characterization
- +Photolithography
- +Plasma
- +Porosimetry/Porometry/Surface Area
- +Powder Mechanics
- +Sample Preparation
- +Spectroscopy
- +Surface Analysis/Characterization
- +Wet Processing
- +X-Ray Analysis/Characterization
- +Other (No Associated Keywords)
| 4 Point Probe Station | Status: Available |
| Bruker Optical Profilometer | Status: Available |
| Electronic Measurement, Lakeshore 7507 | Status: Available |
| Ellipsometer, J.A. Woolam | Status: Available |
| Flexus 2320 | Status: Available |
| Horiba microRaman | Status: Available |
| Nikon LV100 Microscope | Status: Available |
| Photospectrometer, Filmetrics F40 | Status: Available |
| Profilometer, Dektak 150 | Status: Available |
| Profilometer, Tencor AS500 | Status: Available |
| SEM - JEOL 5700 | Status: Available |
| Zeiss Microscope | Status: Available |