SEM - FEI Nova 430 w/EDS & CL - Status: Available

• General Information
• Prerequisites
• Calendar
• Training
• Contacts
• Documents

General Information

Current Status:

Available

Use Rates:

External Academic & Government:

$95.80/Hour

External Affiliated Commercial/Industrial:

$162.20/Hour

External Commercial/Industrial:

$216.30/Hour

External International Academic:

$127.70/Hour

Internal Standard:

$63.90/Hour

Service:

Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.

Building:

NANO (0070)

Room:

FE Sem (134)

In Cleanroom:

No

Main Contact:

Andres Trucco

Description

The FEI Nova NanoSEM 430 is a FE SEM with resolution below 1 nm. The tool has an EDS detector and a monochromatic CL detector included.

TRAINING REQUIREMENTS: Course EMA 6507 or Discussing with staff the content of the following reading material: Goldstein, J.I., Newbury, D.E., Echlin. P., Joy, D.C., Romig, A.D. Jr., Lyman, C.E., Fiori,C., and Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, A Text for Biologists, Materials Scientists, and Geologists. Third Edition. 2003. ISBN 0-306-47292-9 Chapters 2, 3 and 5.
You will be directed to a quiz sign up link when requesting training for any of the SEM's.

Capabilities

The FEI Nova NanoSEM 430 is a state-of-the-art SEM that utilized a field emission electron source and immersion lens technology to obtain resolution below 1 nm. The NanoSEM is capable of imaging from 8X to 300,000X, working distance permitting. Accelerating voltage can be varied from 50V (with beam deceleration) to 30kV. It features a motorized XYZ stage with full 360° rotation and -10° to 90° tilt and can hold a full 4” wafer.