SPM/AFM Dimension 3100 - Status: In Use
General Information
- Current Status:
- In Use
- Use Rates:
- External Academic & Government:
- $64.10/Hour
- External Affiliated Commercial/Industrial:
- $119.70/Hour
- External Commercial/Industrial:
- $159.70/Hour
- External International Academic:
- $85.50/Hour
- Internal Standard:
- $42.70/Hour
- Service:
- Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
- Building:
- NANO (0070)
- In Cleanroom:
- No
- Main Contact:
- Alison Trachet
Description
AFM is a high resolution, nanometer-scale Scanning Probe Microscopy. A stylus or probe is moved across a solid surface following the contours of the topography and provides a three-dimensional image of the surface.
Capabilities
The Digital Instruments Dimension 3100 AFM can provide imaging in tapping mode, and the sample stage can handle up to a 150-mm diameter wafer.
An active Gatorlink login is required to create a new reservation.
