S/TEM - FEI Themis Z - Status: Down

General Information

Current Status:

Down

Use Rates:

External Academic & Government:: $123.60/Hour
External Affiliated Commercial/Industrial:: $231.80/Hour
External Commercial/Industrial:: $309.00/Hour
External International Academic:: $148.30/Hour
Internal Standard:: $82.40/Hour

Service:

Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.

Building:: NANO (0070)
Room:: SPM (137)
In Cleanroom:: No
Main Contact:: Nicholas Rudawski

Description

*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

The FEI Themis Z S/TEM is a state-of-the-art Cs probe-corrected field emission gun scanning/transmission electron microscope capable of providing micro- to pico-scale structural, morphological, magnetic, and chemical information.

Instrument Specifications:

Configured for 60, 200 (default), or 300 kV operation

X-FEG high brightness Schottky field emission gun with Wien filter monochromator; ~0.10 eV energy spread with filtering enabled (at 200 kV)

Cs probe-corrected (to 5th order) S-twin objective lens with 5.4 mm pole piece gap

FEI single-tilt holder, FEI high-visibility, low-background double-tilt (SoftLoc) holder, Gatan Model 636 double-tilt LN2 cooling holder, and Fischione Instruments Model 2021 tomography holder

Piezo-enhanced CompuStage with 20 pm minimum step size

Bottom-mounted FEI Ceta 16 megapixel CMOS camera with speed enhancement

Fischione Instruments Model 3000 HAADF-STEM detector; FEI BF, DF2 (segmented), and DF4 (segmented) STEM detectors for DPC, iDPC, and dDPC imaging

High-resolution (lattice) imaging with <0.1 nm information limit

<100, <80, and <60 pm STEM resolution at 60, 200, and 300 kV, respectively

Dedicated Lorentz lens for TEM mode imaging of magnetic domains; STEM imaging of magnetic domains with ~1 nm resolution enabled by Cs probe-correction and DPC-STEM imaging

Super-X windowless SDD energy dispersive spectroscopy system with 0.7 sr solid angle of collection

Fully automated TEM, STEM, and STEM-EDS tomography data acquisition

Inspect 3D reconstruction and Avizo visualization software for processing and analysis of tomography data (separate onsite workstation)

EMPAD 128x128 direct electron detector; single electron sensitivity with 30 bit dynamic range; diffraction pattern recorded at every pixel in a map (4D-STEM) up to 512x512 resolution

Gatan Continuum ER post-column energy filter; 2.5 and 5.0 mm entrance apertures for EELS and 9 mm entrance aperture for EFTEM; energy selecting slit for EFTEM; DualEELS; BF/ADF STEM detectors

YouTube video demonstrating STEM alignment and <80 pm HAADF-STEM imaging using the Themis Z

YouTube video demonstrating atomic-scale and nanoscale STEM-EDS mapping using the Themis Z

Capabilities

<100 pm resolution HAADF, LAADF, BF, ADF, ABF, DPC, iDPC, dDPC, and 4D STEM imaging
Atomic-resolution EDS and EELS mapping
High-resolution (~0.10 eV) EELS for fine-structure analysis
Fully automated EDS tomography
Energy filtered (zero loss, elemental mapping) TEM imaging
Lorentz TEM and STEM imaging of magnetic domains
High-resolution (lattice) TEM imaging with <0.1 nm information limit
Selected area, precession, and convergent beam electron diffraction