MAIC Equipment by Keywords
To reserve equipment time, or to view more information about an equipment, click on the equipment name. Visit the Equipment Rates page for our equipment rate schedule.
| Keyword | Name | Status |
|---|---|---|
| Electron Microscopy/Microanalysis | Cameca SX Five FE EPMA | Available |
| Electron Microscopy/Microanalysis | FIB/SEM - FEI Helios G4 PFIB CXe dual beam | Available |
| Electron Microscopy/Microanalysis | FIB/SEM - Thermo Fisher Scios 2 dual beam | Available |
| Electron Microscopy/Microanalysis | S/TEM - FEI Talos F200i | Down |
| Electron Microscopy/Microanalysis | S/TEM - FEI Themis Z | Down |
| Electron Microscopy/Microanalysis | SEM - FEI Nova 430 w/EDS & CL | Available |
| Electron Microscopy/Microanalysis | SEM - Hitachi S-3000 | Down |
| Electron Microscopy/Microanalysis | SEM - Tescan MIRA3 | Available |
| Metrology | Bruker Optical Profilometer | Available |
| Metrology | Ellipsometer, J.A. Woolam | Available |
| Metrology | Horiba microRaman | Available |
| Metrology | Profilometer, Tencor AS500 | Available |
| Sample Preparation | Allied Multi-prep Lapping and Polishing system | Available |
| Sample Preparation | Coater - Carbon | Available |
| Sample Preparation | Coater - Hummer V Au-Pd | Available |
| Sample Preparation | Coater - SPI Au-Pd | Available |
| Spectroscopy | Horiba microRaman | Available |
| Spectroscopy | SEM - FEI Nova 430 w/EDS & CL | Available |
| Surface Analysis/Characterization | Bruker Optical Profilometer | Available |
| Surface Analysis/Characterization | Ellipsometer, J.A. Woolam | Available |
| Surface Analysis/Characterization | Perkin-Elmer PHI 660 - AES | Available |
| Surface Analysis/Characterization | SPM/AFM Dimension 3100 | Available |
| Surface Analysis/Characterization | XPS - ULVAC-PHI XPS | Available |
| X-Ray Analysis/Characterization | Amira - Tomography Software | Up |
| X-Ray Analysis/Characterization | Nano-CT - GE v|tome|x m 240 | In Use |
| X-Ray Analysis/Characterization | Nano-CT Image Processing/Reconstruction System | Available |
| X-Ray Analysis/Characterization | Panalytical XPert MRD | Down |
| X-Ray Analysis/Characterization | Panalytical XPert Powder | Available |
| X-Ray Analysis/Characterization | XRD Software Workstation | Available |
| X-Ray Analysis/Characterization | ZEISS Versa 620 XRM | In Use |
