Equipment by Keywords
Click on keyword to expand or minimize the panels below. To reserve equipment time, or to view more information about an equipment, click on the equipment name. Visit the Equipment Rates page for our equipment rate schedule.
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Show:
- +3D Printing
- +Dicing/Bonding
- +Electron Microscopy/Microanalysis
- +Film Deposition
- +Hot Processing
- +Metrology
- +Other Analytical Techniques
- +Particle Analysis/Characterization
- +Photolithography
- +Plasma
- +Porosimetry/Porometry/Surface Area
- +Powder Mechanics
- +Sample Preparation
- +Spectroscopy
- -Surface Analysis/Characterization
- +Wet Processing
- +X-Ray Analysis/Characterization
- +Other (No Associated Keywords)
| Bruker Optical Profilometer | Status: Available |
| Ellipsometer, J.A. Woolam | Status: Available |
| Perkin-Elmer PHI 660 - AES | Status: Down |
| SPM/AFM Dimension 3100 | Status: Available |
| XPS - ULVAC-PHI XPS | Status: Available |