S/TEM - FEI Talos F200i - Status: Available
General Information
- Current Status:
- Available
- Use Rates:
- External Academic & Government:
- $111.20/Hour
- External Affiliated Commercial/Industrial:
- $193.10/Hour
- External Commercial/Industrial:
- $257.50/Hour
- External International Academic:
- $148.30/Hour
- Internal Standard:
- $74.20/Hour
- Service:
- Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
- Building:
- NANO (0070)
- Room:
- FIB Room (136)
- In Cleanroom:
- No
- Main Contact:
- Nicholas Rudawski
Description
*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*
*USERS WORKING ON RADIOACTIVE MATERIALS SHOULD REQUEST TRAINING ON THE TECNAI HERE*
The FEI Talos F200i S/TEM is a state-of-the-art field emission gun scanning/transmission electron microscope capable of providing micro- to sub nm-scale structural, morphological, and chemical information.
Instrument Specifications:
- Configured for 80 or 200 (default) kV operation
- S-FEG Schottky field emission gun
- X-twin objective lens (Cs = 1.2 mm at 200 kV)
- FEI single-tilt and high-visibility, low-background double-tilt (hex ring) holders available
- Bottom-mounted FEI Ceta 16 megapixel CMOS camera
- Fischione Instruments Model 3000 HAADF-STEM detector; FEI BF, DF2 (segmented), and DF4 (segmented) STEM detectors for DPC, iDPC and dDPC imaging
- High-resolution (lattice) imaging with <0.1 nm information limit (at 200 kV)
- 0.16 nm STEM resolution (at 200 kV)
- Bruker XFlash 6T|30 windowless SDD (30 square mm active area) energy dispersive spectroscopy system
- Atomic-resolution HAADF, LAADF, BF, ADF, ABF, DPC, iDPC, and dDPC, STEM imaging
- ~1 nm resolution EDS mapping
- Bright-field, centered dark-field, weak-beam dark-field, and conical dark-field TEM imaging
- High-resolution (lattice) TEM imaging with <0.1 nm information limit
- Selected area and convergent beam electron diffraction
YouTube video playlist (tutorials, concepts, and fundamentals related to TEM)
YouTube video demonstrating basic conventional (static beam) mode operation of the Talos
YouTube video demonstrating STEM mode operation of the Talos
YouTube video demonstrating spatially-resolved EDS using the Talos in STEM mode
YouTube video demonstrating collection of selected area diffraction patterns using the Ceta camera
Zoom workshop on atomic-resolution STEM (recorded 04/14/21)
YouTube video demonstrating an alternative STEM alignment method
Zoom workshop on S/TEM tips, tricks, and other helpful info (recorded 04/29/22)
TRAINING REQUIREMENTS:
1. Please create an NRF user account with a PI-approved funding source.
2. Please complete NRF general safety training.
3. Please complete the S/TEM Prerequisite Training online course through eLearning; submit a training request using the "Training" link at the bottom of the page and follow the instructions to be added to the course; this course must be completed regardless of any prior coursework or operational experience related to S/TEM you may have.
Capabilities
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