Ellipsometer, J.A. Woolam - Status: Available
General Information
- Current Status:
- Available
- Use Rates:
- External Academic & Government:
- $32.40/Hour
- External Affiliated Commercial/Industrial:
- $32.40/Hour
- External Commercial/Industrial:
- $43.30/Hour
- External International Academic:
- $43.30/Hour
- Internal Standard:
- $21.60/Hour
- Service:
- Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
- Building:
- NANO (0070)
- In Cleanroom:
- No
- Main Contact:
- David Hays
Description
The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.
Capabilities
The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.
An active Gatorlink login is required to create a new reservation.
