Staff
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Dempere, Luisa Amelia Engineer, NRF Director 110 NRF, POB 116400 Ph: (352) 846-2200 ademp@eng.ufl.edu Show Bio | Interests & Expertise |
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| Bio: Luisa Amelia Dempere is a faculty member and the director of the Research Service Centers (RSC) of the Herbert Wertheim College of Engineering (COE) at the University of Florida (UF). She received her M.S. and Ph.D. in Materials Science and Engineering at UF. Her expertise resides in the areas of materials characterization and analysis, and analytical instrumentation, particularly electron microscopy and microanalysis. Her teaching, research and graduate advising activities are conducted in the department of Materials Science and Engineering, while her administrative role gets accomplished through her involvement in several shared-governance campus committees and as the director of the RSC. | |
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Downing, Marco Engineer 104 NRF, POB 116621 Ph: (352) 273-2287 madowning@ufl.edu |
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Gapinski, Scott Facilities Manager 107 NRF, POB 116500 Ph: (352) 392-7878 gap@nimet.ufl.edu Interests & Expertise |
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Gila, Brent Associate Director 108 NRF, POB 116621 Ph: (352) 273-2245, Fax: (352) 846-2877 bgila@ufl.edu Interests & Expertise |
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Hays, David Engineering Technician & Scientist 104 NRF, POB 116621 Ph: (352) 273-2286 dhays@nimet.ufl.edu Show Bio | Interests & Expertise |
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| Bio: David Hays is a staff scientist/engineer and holds a PhD in Materials Science and Engineering from the University of Florida. He is responsible for maintaining, operating and training users on majority of the tools inside the cleanroom. He specifically oversees the plasma etching and metrology tools, and is the principal scientist for x-ray photoelectron spectroscopy. In addition, he has over ten years of industry experience working at Sony Semiconductor and GE Global Research as a process and device development engineer. Within the fields of MEMS and nanotechnology he has written over 60 publications and holds numerous patents. | |
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Kennedy, Lenny Fiscal Officer 109 NRF, POB 116621 Ph: (352) 392-6985 lkenn@ufl.edu |
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Lewis, Bill Engineering Technician & Scientist 104 NRF, POB 116621 Ph: (352) 273-2285 walewis@ufl.edu Show Bio | Interests & Expertise |
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| Bio: Bill Lewis is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. His specific area of expertise is photolithography and metrology and has been a part of the NRF since 2003. Prior to joining the NRF, Bill spent 20 years in the semiconductor industry working for Texas Instruments, Intel Corp. and Agere Systems. His rolls ranged from process and maintenance support of photolithography equipment to defect reduction. | |
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Lewis, Jason Administrative Support Assistant 111 NRF, POB 116621 Ph: (352) 846-2626 jd.lewis@ufl.edu |
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Marton, Hunter Facilities Support Assistant 184A NRF, POB 116621 Ph: (352) 846-2626 huntermarton@ufl.edu |
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Norton, Greg Systems Admin/Programmer 106 NRF, POB 116621 Ph: (352) 846-1712 gnorton@ufl.edu |
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Rudawski, Nicholas Associate Engineer 104 POB 116400 Ph: 352-392-3077 ngr@ufl.edu Hide Bio | Interests & Expertise |
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| Bio: Nicholas G. Rudawski received his B.S.E. degree in Materials Science and Engineering from the University of Michigan in 2005 while researching growth and characterization of III-V semiconductors; he completed his Ph.D. degree in Materials Science and Engineering from the University of Florida in 2008 studying structure-processing-property relationships in ion-implanted Si. Subsequently, he completed post-doctoral training at the University of California at Santa Barbara in transmission electron microscopy of complex oxides and semiconductors before returning to the University of Florida for additional post-doctoral training in electrochemical studies of elemental semiconductors for Li ion battery applications. He joined the Research Service Centers in August of 2012 as service/teaching faculty, where he primarily oversees the transmission electron microscopes and dual beam scanning electron microscope/focused ion beams. He has authored/coauthored 50 peer-reviewed publications contributed over 30 conference presentations since 2003. His current CV is available upon request. | |
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Santana, Arman 104 NRF Ph: (352) 846-2626 a.santana@ufl.edu |
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Scheiffele, Gary Engineer III 104 NRF, POB 116621 Ph: (352) 846-1733 gscheiffele@eng.ufl.edu Show Bio | Interests & Expertise |
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| Bio: Gary Scheiffele worked in the Materials Science Department in ceramics processing from 1983-1998 and then joined the Particle Engineering Research Center, the auxiliary side of which became PAIC in 2012. His expertise is in analysis of particles and particle systems, including IR and Raman spectroscopy, pore characterization, rheology, particle size and zeta potential analysis as well as X-ray computed tomography (CT). | |
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Schepker, Kristy Engineering Technician & Scientist 104 POB 116621 Ph: (352) 273-2252 kschepker@ufl.edu Interests & Expertise |
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Trachet, Alison Engineer II 104 NRF, POB 116621 Ph: (352) 222-9124 aat425@ufl.edu |
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Trucco, Andres Engineering Technician & Scientist 104 NRF, POB 116621 Ph: (352) 294-7517 andres5@ufl.edu Show Bio | Interests & Expertise |
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| Bio: Andres holds a bachelor’s degree in Industrial Engineering from the University of Florida. He has worked in industry for over 10 years in the areas of facilities, nanofabrication, process development and testing. Whiting the fields of nanofabrication he holds several patents. Some of his expertize include: E-beam lithography for nanofabrication of multilayer devices and 2D materials. Manufacturing of nano photonic devices via EBL and electrodeposition. Experience with process integration of photonic devices and vacuum chambers. Experience with FIB Lithography. Fluent on characterization techniques such as EPMA, SEM, EDS, profilometry and optical testing. | |