Staff

Dempere, Luisa Amelia
Engineer, NRF Director
110 NRF, POB 116400
Ph: (352) 846-2200
ademp@eng.ufl.edu
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Bio: Luisa Amelia Dempere is a faculty member and the director of the Research Service Centers (RSC) of the Herbert Wertheim College of Engineering (COE) at the University of Florida (UF). She received her M.S. and Ph.D. in Materials Science and Engineering at UF. Her expertise resides in the areas of materials characterization and analysis, and analytical instrumentation, particularly electron microscopy and microanalysis. Her teaching, research and graduate advising activities are conducted in the department of Materials Science and Engineering, while her administrative role gets accomplished through her involvement in several shared-governance campus committees and as the director of the RSC.
Downing, Marco
Engineer
104 NRF, POB 116621
Ph: (352) 273-2287
madowning@ufl.edu
Gapinski, Scott
Facilities Manager
107 NRF, POB 116500
Ph: (352) 392-7878
gap@nimet.ufl.edu
Interests & Expertise
Gila, Brent
Associate Director
108 NRF, POB 116621
Ph: (352) 273-2245, Fax: (352) 846-2877
bgila@ufl.edu
Interests & Expertise
Hays, David
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 273-2286
dhays@nimet.ufl.edu
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Bio: David Hays is a staff scientist/engineer and holds a PhD in Materials Science and Engineering from the University of Florida. He is responsible for maintaining, operating and training users on majority of the tools inside the cleanroom. He specifically oversees the plasma etching and metrology tools, and is the principal scientist for x-ray photoelectron spectroscopy. In addition, he has over ten years of industry experience working at Sony Semiconductor and GE Global Research as a process and device development engineer. Within the fields of MEMS and nanotechnology he has written over 60 publications and holds numerous patents.
Kennedy, Lenny
Fiscal Officer
109 NRF, POB 116621
Ph: (352) 392-6985
lkenn@ufl.edu
Lewis, Bill
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 273-2285
walewis@ufl.edu
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Bio: Bill Lewis is a staff scientist/engineer and is responsible for maintaining, operating and training users on all of the tools at the NRF. His specific area of expertise is photolithography and metrology and has been a part of the NRF since 2003. Prior to joining the NRF, Bill spent 20 years in the semiconductor industry working for Texas Instruments, Intel Corp. and Agere Systems. His rolls ranged from process and maintenance support of photolithography equipment to defect reduction.
Lewis, Jason
Administrative Support Assistant
111 NRF, POB 116621
Ph: (352) 846-2626
jd.lewis@ufl.edu
Marton, Hunter
Facilities Support Assistant
184A NRF, POB 116621
Ph: (352) 846-2626
huntermarton@ufl.edu
Norton, Greg
Systems Admin/Programmer
106 NRF, POB 116621
Ph: (352) 846-1712
gnorton@ufl.edu
Rudawski, Nicholas
Associate Engineer
104 POB 116400
Ph: 352-392-3077
ngr@ufl.edu
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Bio: Nicholas G. Rudawski received his B.S.E. degree in Materials Science and Engineering from the University of Michigan in 2005 while researching growth and characterization of III-V semiconductors; he completed his Ph.D. degree in Materials Science and Engineering from the University of Florida in 2008 studying structure-processing-property relationships in ion-implanted Si. Subsequently, he completed post-doctoral training at the University of California at Santa Barbara in transmission electron microscopy of complex oxides and semiconductors before returning to the University of Florida for additional post-doctoral training in electrochemical studies of elemental semiconductors for Li ion battery applications. He joined the Research Service Centers in August of 2012 as service/teaching faculty, where he primarily oversees the transmission electron microscopes and dual beam scanning electron microscope/focused ion beams. He has authored/coauthored 50 peer-reviewed publications contributed over 30 conference presentations since 2003. His current CV is available upon request.
Santana, Arman

104 NRF
Ph: (352) 846-2626
a.santana@ufl.edu
Scheiffele, Gary
Engineer III
104 NRF, POB 116621
Ph: (352) 846-1733
gscheiffele@eng.ufl.edu
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Bio: Gary Scheiffele worked in the Materials Science Department in ceramics processing from 1983-1998 and then joined the Particle Engineering Research Center, the auxiliary side of which became PAIC in 2012. His expertise is in analysis of particles and particle systems, including IR and Raman spectroscopy, pore characterization, rheology, particle size and zeta potential analysis as well as X-ray computed tomography (CT).
Schepker, Kristy
Engineering Technician & Scientist
104 POB 116621
Ph: (352) 273-2252
kschepker@ufl.edu
Interests & Expertise
Trachet, Alison
Engineer II
104 NRF, POB 116621
Ph: (352) 222-9124
aat425@ufl.edu
Trucco, Andres
Engineering Technician & Scientist
104 NRF, POB 116621
Ph: (352) 294-7517
andres5@ufl.edu
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Bio: Andres holds a bachelor’s degree in Industrial Engineering from the University of Florida. He has worked in industry for over 10 years in the areas of facilities, nanofabrication, process development and testing. Whiting the fields of nanofabrication he holds several patents. Some of his expertize include: E-beam lithography for nanofabrication of multilayer devices and 2D materials. Manufacturing of nano photonic devices via EBL and electrodeposition. Experience with process integration of photonic devices and vacuum chambers. Experience with FIB Lithography. Fluent on characterization techniques such as EPMA, SEM, EDS, profilometry and optical testing.