FIB/SEM - Thermo Fisher Scios 2 dual beam - Status: Available
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The Thermo Scientifc™ Scios™ 2 DualBeam™ Focused Ion Beam Scanning Electron microscope (FIB-SEM) is an SEM paired with a Ga FIB to produce high-quality, site-specific STEM lamella and cross sections. It is equipped with an EasyLift System for in situ sample manipulation including removing lamella from bulk samples and attaching to STEM grids.
TF Scios 2 Datasheet Wikipedia FIB |
| Training Topic | Description | Rates | Approx Session Length (hrs) |
|---|---|---|---|
| Thermo Fisher Scios 2 Base Training - General Operation | Standard Rate: $123.00/Complete User Training, No-Charge Rate: $0.00/Complete User Training | N/A | |
| Thermo Fisher Scios 2 Base Training - Cross Over Training | Standard Rate: $82.00/Complete User Training, No-Charge Rate: $0.00/Complete User Training | N/A |
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