FIB/SEM - Thermo Fisher Scios 2 dual beam - Status: Available

Current Status: Available
Training: View Topics/Sessions
Use Rates:
- External Academic & Government: $103.50/Hour
- External Affiliated Commercial/Industrial: $199.30/Hour
- External Commercial/Industrial: $265.70/Hour
- External International Academic: $138.00/Hour
- Internal Standard: $69.00/Hour
Building: NANO (0070)
Room: SPM (137)
In Cleanroom: No
Main Contact: Alison Trachet

The Thermo Scientifc™ Scios™ 2 DualBeam™ Focused Ion Beam Scanning Electron microscope (FIB-SEM) is an SEM paired with a Ga FIB to produce high-quality, site-specific STEM lamella and cross sections. It is equipped with an EasyLift System for in situ sample manipulation including removing lamella from bulk samples and attaching to STEM grids.

TF Scios 2 Datasheet

Wikipedia FIB

Capabilities Training Prerequisites Calendar Contacts Docs

Contact Level	Name	Email
1	Trachet, Alison	aat425@ufl.edu
2	Rudawski, Nicholas	ngr@ufl.edu

General Contact: nrfinfo@mail.ufl.edu

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