FIB/SEM - Thermo Fisher Scios 2 dual beam - Status: Available

Current Status: Available
Training: View Topics/Sessions
Use Rates:
- External Academic & Government: $103.50/Hour
- External Affiliated Commercial/Industrial: $199.30/Hour
- External Commercial/Industrial: $265.70/Hour
- External International Academic: $138.00/Hour
- Internal Standard: $69.00/Hour
Building: NANO (0070)
Room: SPM (137)
In Cleanroom: No
Main Contact: Alison Trachet

The Thermo Scientifc™ Scios™ 2 DualBeam™ Focused Ion Beam Scanning Electron microscope (FIB-SEM) is an SEM paired with a Ga FIB to produce high-quality, site-specific STEM lamella and cross sections. It is equipped with an EasyLift System for in situ sample manipulation including removing lamella from bulk samples and attaching to STEM grids.

TF Scios 2 Datasheet

Wikipedia FIB

Capabilities Training Prerequisites Calendar Contacts Docs

Use Prerequisites

Prerequisite	Description	Status
Computer Access	Requires computer access be setup	Check Your Status
Funding Source	Requires permission to an active funding source	Check Your Status
FIB Competency	Requires completion of FIB Competency Quiz	Check Your Status
Work Plan	Requires a work plan be approved by PI and staff	Check Your Status
Agreement Form	Requires completed agreement form for equipment usage	Check Your Status
NRF Safety Training	Requires completion of safety training	Check Your Status
UF myTraining Course Completion	Requires completion of myTraining courses.	Check Your Status
NRF Building Access	Requires issue of an id badge and entry badge and/or access level to be set.	Check Your Status
Equipment Training	Requires completion of equipment training	Check Your Status

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