FIB/SEM - FEI Helios G4 PFIB CXe dual beam - Status: In Use
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*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*
PLEASE NOTE: published rates are for the first 8 hours of usage; the rates then decrease as specified below (runs not to exceed 24 hours in total):
The FEI Helios G4 PFIB CXe DualBeam system integrates focused ion and scanning electron beams for FIB and SEM functionality in one instrument. Instrument Specifications: Virtual workshop: (recorded 11/19/21) dual FIB/SEM tips, tricks, and other useful info YouTube tutorial: EBSD using EDAX Velocity EBSD camera and TEAM software EDAX webinar: introduction to EBSD YouTube tutorial: PFIB S/TEM lamella prep YouTube tutorial: In-situ UHR SEM imaging of PFIB-prepared cross-sections TRAINING REQUIREMENTS: 1. Please create an NRF user account with a PI-approved funding source. 2. Please complete NRF general safety training. 3. Please complete the FIB Knowledge Training course through eLearning; submit a training request using the "Training" link at the bottom of the page and follow the instructions to be added to the course; you must complete this course regardless of any prior coursework or operational experience related to SEM or FIB you may have. |
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EBSD reading: basics, present state | Download |
EBSD reading: EDAX camera optimization presentation | Download |
EBSD reading: EDAX grains and antigrains presentation | Download |
EBSD reading: EDAX sample prep presentation | Download |
EDAX APEX EDS Manual | Download |
Equipment image | Download |
Helios G4 PFIB - basic operation | Download |
Helios G4 PFIB - EDAX APEX EBSD SOP | Download |
Helios G4 PFIB - EDAX APEX EDS SOP | Download |
Helios G4 PFIB - EDAX TEAM EBSD SOP | Download |
Helios G4 PFIB - lamella prep recipe | Download |
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