FIB/SEM - FEI Helios G4 PFIB CXe dual beam - Status: In Use
  • Current Status: In Use
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $100.50/Hour
    • External Affiliated Commercial/Industrial: $193.50/Hour
    • External Commercial/Industrial: $258.00/Hour
    • External International Academic: $134.00/Hour
    • Internal Standard: $67.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: Dual-Beam Fib (132)
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
 *ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

PLEASE NOTE: published rates are for the first 8 hours of usage; the rates then decrease as specified below (runs not to exceed 24 hours in total):
Capabilities Training Prerequisites Calendar Contacts Docs

  • Ga-free S/TEM lamella preparation via in-situ lift-out method
  • Rapid, large scale (>100 um) cross-section face preparation
  • High-resolution (<1 nm) top-down and cross-sectional SEM imaging
  • Nanoscale (<100 nm) to microscale (>1 um) electron and ion beam-assisted milling, patterning, and deposition
  • Automated serial sectioning and cross-section face imaging
  • Nanoscale (<100 nm) to microscale (>1 um) compositional analysis using EDS
  • Nanoscale (<100 nm) to microscale (>1 um) texture and crystallographic analysis using EBSD

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