SEM - FEI Nova 430 w/EDS & CL - Status: Available
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The FEI Nova NanoSEM 430 is a FE SEM with resolution below 1 nm. The tool has an EDS detector and a monochromatic CL detector included.
Scanning Electron Microscopy wiki link Guide to SEM Observation Energy-Dispersive x-ray Spectroscopy (EDS) wiki link Cathodoluminescence wiki link TRAINING REQUIREMENTS: Course EMA 6507 or Discussing with staff the content of the following reading material: Goldstein, J.I., Newbury, D.E., Echlin. P., Joy, D.C., Romig, A.D. Jr., Lyman, C.E., Fiori,C., and Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, A Text for Biologists, Materials Scientists, and Geologists. Third Edition. 2003. ISBN 0-306-47292-9 Chapters 2, 3 and 5. You will be directed to a quiz sign up link when requesting training for any of the SEM's. |
Contact Level | Name | |
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1 | Trucco, Andres | andres5@ufl.edu |
2 | Trachet, Alison | aat425@ufl.edu |
3 | Hays, David | dhays@nimet.ufl.edu |
4 | Gila, Brent | bgila@ufl.edu |
General Contact: nrfinfo@mail.ufl.edu
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