Ellipsometer, J.A. Woolam - Status: Available

Current Status: Available
Training: View Topics/Sessions
Use Rates:
- External Academic & Government: $32.40/Hour
- External Affiliated Commercial/Industrial: $32.40/Hour
- External Commercial/Industrial: $43.30/Hour
- External International Academic: $43.30/Hour
- Internal Standard: $21.60/Hour
Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
Building: NANO (0070)
Room: Device Assembly & Processing (122)
In Cleanroom: No
Main Contact: David Hays

The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.

Ellipsometry wiki link

Capabilities Training Prerequisites Calendar Contacts Docs

Training Topic	Description	Rates	Approx Session Length (hrs)
Ellipsometer J.A. Woolam Training		Standard Rate: $39.00/Complete User Training	1

Start	End	Availability	Location	Options
Tue, Jan. 6, 2026 9:00 AM	Tue, Jan. 6, 2026 10:00 AM	1 Seats out of 1	NRF	Sign Up
Mon, Jan. 19, 2026 1:30 PM	Mon, Jan. 19, 2026 2:30 PM	1 Seats out of 1	NRF	Sign Up
Tue, Feb. 3, 2026 9:00 AM	Tue, Feb. 3, 2026 10:00 AM	1 Seats out of 1	NRF	Sign Up
Mon, Feb. 16, 2026 1:30 PM	Mon, Feb. 16, 2026 2:30 PM	1 Seats out of 1	NRF	Sign Up

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