Ellipsometer, J.A. Woolam - Status: Available
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The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.
Ellipsometry wiki link |
Training Topic | Description | Rates | Approx Session Length (hrs) |
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Ellipsometer J.A. Woolam Training | Standard Rate: $39.00/Complete User Training | 1 |
Start | End | Availability | Location | |
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Mon, Apr. 14, 2025 1:30 PM | Mon, Apr. 14, 2025 2:30 PM | 1 Seats out of 1 | NRF | Sign Up |
Tue, Apr. 29, 2025 9:00 AM | Tue, Apr. 29, 2025 10:00 AM | 1 Seats out of 1 | NRF | Sign Up |
Mon, May. 12, 2025 1:30 PM | Mon, May. 12, 2025 2:30 PM | 1 Seats out of 1 | NRF | Sign Up |
Tue, May. 27, 2025 9:00 AM | Tue, May. 27, 2025 10:00 AM | 1 Seats out of 1 | NRF | Sign Up |
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