Ellipsometer, J.A. Woolam - Status: Available
  • Current Status: Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $31.50/Hour
    • External Affiliated Commercial/Industrial: $31.50/Hour
    • External Commercial/Industrial: $42.00/Hour
    • External International Academic: $42.00/Hour
    • Internal Standard: $21.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: Device Assembly & Processing (122)
  • In Cleanroom: No
  • Main Contact: David Hays
 The ellipsometer is able to measure the refractive index and the thickness of semi-transparent thin films. It can be used to measure layers as thin as 1 nm up to layers which are one micron thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.

Ellipsometry wiki link
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