SPM/AFM Dimension 3100 - Status: Available
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Scanning Probe Microscope/ Atomic Force Microscope AFM is a high resolution, nano meter scale, type of Scanning Probe Microscopy. A stylus or probe is moved across a solid surface following the contours of the topography and provides a three dimensional image of the surface. https://simple.wikipedia.org/wiki/Atomic_force_microscope |
Training Topic | Description | Rates | Approx Session Length (hrs) |
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Dimension 3100 SPM/AFM Training | Standard Rate: $51.00/Complete User Training | N/A |
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