SPM/AFM Dimension 3100 - Status: Available

Current Status: Available
Training: View Topics/Sessions
Use Rates:
- External Academic & Government: $64.10/Hour
- External Affiliated Commercial/Industrial: $119.70/Hour
- External Commercial/Industrial: $159.70/Hour
- External International Academic: $85.50/Hour
- Internal Standard: $42.70/Hour
Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
Building: NANO (0070)
Room: Particle Analysis 2 (224)
In Cleanroom: No
Main Contact: Alison Trachet

AFM is a high resolution, nanometer-scale Scanning Probe Microscopy. A stylus or probe is moved across a solid surface following the contours of the topography and provides a three-dimensional image of the surface.

Capabilities Training Prerequisites Calendar Contacts Docs

The Digital Instruments Dimension 3100 AFM can provide imaging in tapping mode, and the sample stage can handle up to a 150-mm diameter wafer.

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