S/TEM - FEI Themis Z - Status: Available
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*ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*
The FEI Themis Z S/TEM is a state-of-the-art Cs probe-corrected field emission gun scanning/transmission electron microscope capable of providing micro- to pico-scale structural, morphological, magnetic, and chemical information; it is the most advanced electron microscope of any kind within a 500 mi radius of the University of Florida. Instrument Specifications: YouTube video demonstrating STEM alignment and <80 pm HAADF-STEM imaging using the Themis Z YouTube video demonstrating atomic-scale and nanoscale STEM-EDS mapping using the Themis Z |
Training Topic | Description | Rates | Approx Session Length (hrs) |
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FEI Themis Z S/TEM Base Training – Conventional BF/HR and STEM Imaging; EDS in STEM Mode | Standard Rate: $240.00/Complete User Training, No-Charge Rate: $0.00/Complete User Training | N/A | |
FEI Themis Z S/TEM Add-On Training - EELS in STEM Mode (Point Analysis, Linescans, and Maps) | Standard Rate: $141.75/Complete User Training, No-Charge Rate: $0.00/Complete User Training | N/A |
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Request and Sign Up for FEI Themis Z S/TEM Base Training – Conventional BF/HR and STEM Imaging; EDS in STEM Mode | Request and Sign Up for FEI Themis Z S/TEM Add-On Training - EELS in STEM Mode (Point Analysis, Linescans, and Maps) | Request and Sign Up for Priority FEI Themis Z S/TEM Add-On Training - EELS in STEM Mode (Point Analysis, Linescans, and Maps)
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