S/TEM - FEI Themis Z - Status: Available
  • Current Status: Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $120.00/Hour
    • External Affiliated Commercial/Industrial: $225.00/Hour
    • External Commercial/Industrial: $300.00/Hour
    • External International Academic: $144.00/Hour
    • Internal Standard: $80.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: SPM (137)
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
 *ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

The FEI Themis Z S/TEM is a state-of-the-art Cs probe-corrected field emission gun scanning/transmission electron microscope capable of providing micro- to pico-scale structural, morphological, magnetic, and chemical information; it is the most advanced electron microscope of any kind within a 500 mi radius of the University of Florida.

Instrument Specifications:

  • Configured for 60, 200 (default), or 300 kV operation
  • X-FEG high brightness Schottky field emission gun with Wien filter monochromator; ~0.10 eV energy spread with filtering enabled (at 200 kV)
  • Cs probe-corrected (to 5th order) S-twin objective lens with 5.4 mm pole piece gap
  • FEI single-tilt holder, FEI high-visibility, low-background double-tilt (SoftLoc) holder, Gatan Model 636 double-tilt LN2 cooling holder, and Fischione Instruments Model 2021 tomography holder
  • Piezo-enhanced CompuStage with 20 pm minimum step size
  • Bottom-mounted FEI Ceta 16 megapixel CMOS camera with speed enhancement
  • Fischione Instruments Model 3000 HAADF-STEM detector; FEI BF, DF2 (segmented), and DF4 (segmented) STEM detectors for DPC, iDPC, and dDPC imaging
  • High-resolution (lattice) imaging with <0.1 nm information limit
  • <100, <80, and <60 pm STEM resolution at 60, 200, and 300 kV, respectively
  • Dedicated Lorentz lens for TEM mode imaging of magnetic domains; STEM imaging of magnetic domains with ~1 nm resolution enabled by Cs probe-correction and DPC-STEM imaging
  • Super-X windowless SDD energy dispersive spectroscopy system with 0.7 sr solid angle of collection
  • Fully automated TEM, STEM, and STEM-EDS tomography data acquisition
  • Inspect 3D reconstruction and Avizo visualization software for processing and analysis of tomography data (separate onsite workstation)
  • EMPAD 128x128 direct electron detector; single electron sensitivity with 30 bit dynamic range; diffraction pattern recorded at every pixel in a map (4D-STEM) up to 512x512 resolution
  • Gatan Continuum ER post-column energy filter; 2.5 and 5.0 mm entrance apertures for EELS and 9 mm entrance aperture for EFTEM; energy selecting slit for EFTEM; DualEELS; BF/ADF STEM detectors

    • YouTube video demonstrating STEM alignment and <80 pm HAADF-STEM imaging using the Themis Z

    YouTube video demonstrating atomic-scale and nanoscale STEM-EDS mapping using the Themis Z
    Capabilities Training Prerequisites Calendar Contacts Docs

    Use Prerequisites

    PrerequisiteDescriptionStatus
    Funding SourceRequires permission to an active funding sourceCheck Your Status
    Agreement FormRequires completed agreement form for equipment usageCheck Your Status
    NRF Safety TrainingRequires completion of safety trainingCheck Your Status

    An active Gatorlink login is required to create a new reservation.