SEM - Tescan MIRA3 - Status: Down
  • Current Status: Down
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $93.00/Hour
    • External Affiliated Commercial/Industrial: $157.50/Hour
    • External Commercial/Industrial: $210.00/Hour
    • External International Academic: $124.00/Hour
    • Internal Standard: $62.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: EPMA Lab (285)
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
 *ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

Rate Notes: Published rates are for first 8 hours. Rate then decreases to $15.50/hr. for Internal Standard - $23.25/hr. for External Academic & Gov. - $31/hr. for External Int. Academic - $46.50/hr. for External Affiliated Commercial/Industrial - $62/hr. for External Commercial/Industrial.
    Runs not to exceed 24 hours in total.

    The Tescan MIRA3 scanning electron microscope rasters a focused energetic beam (probe) of electrons across a specimen surface. The interactions of the beam with the specimen are detected and then recorded as a function of probe position and used to generate two-dimensional images of the specimen. The signals that can be detected include secondary and backscattered electrons (for imaging), X-rays (for chemical analysis), and electron backscattered diffraction patterns (for structural analysis).

    Instrument Specifications:

  • Schottky field emission gun; 0.3 - 30 kV operating voltage
  • Everhart-Thornley and dedicated backscattered electron detectors; SE+BSE or BSE only imaging
  • EDAX Octane Pro (10 mm squared active area) SDD EDS
  • EDAX Hikari Plus CCD EBSD camera. FOR USE OF THE EBSD FOR MORE THAN 8 HOURS, PLEASE CONTACT THE NRF FOR LONG RUNS RATES
  • EDAX OIM Analysis 8 software

    • EDAX webinar: introduction to EBSD

    TRAINING REQUIREMENTS: Course EMA 6507 or Discussing with staff the content of the following reading material: Goldstein, J.I., Newbury, D.E., Echlin. P., Joy, D.C., Romig, A.D. Jr., Lyman, C.E., Fiori,C., and Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, A Text for Biologists, Materials Scientists, and Geologists. Third Edition. 2003. ISBN 0-306-47292-9 Chapters 2, 3 and 5. You will be directed to a quiz sign up link when requesting training for any of the SEM's.
Capabilities Training Prerequisites Calendar Contacts Docs

Use Prerequisites

PrerequisiteDescriptionStatus
Computer AccessRequires computer access be setupCheck Your Status
Funding SourceRequires permission to an active funding sourceCheck Your Status
SEM CompetencyRequires completion of SEM Competency QuizCheck Your Status
Work PlanRequires a work plan be approved by PI and staffCheck Your Status
Agreement FormRequires completed agreement form for equipment usageCheck Your Status
NRF Safety TrainingRequires completion of safety trainingCheck Your Status
NRF Building AccessRequires issue of an id badge and entry badge and/or access level to be set.Check Your Status
Equipment TrainingRequires completion of equipment trainingCheck Your Status

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