SEM - Tescan MIRA3 - Status: Down
  • Current Status: Down
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $93.00/Hour
    • External Affiliated Commercial/Industrial: $157.50/Hour
    • External Commercial/Industrial: $210.00/Hour
    • External International Academic: $124.00/Hour
    • Internal Standard: $62.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: EPMA Lab (285)
  • In Cleanroom: No
  • Main Contact: Nicholas Rudawski
 *ANALYSIS OF RADIOACTIVE SPECIMENS WITH THIS INSTRUMENT IS STRICTLY PROHIBITED*

Rate Notes: Published rates are for first 8 hours. Rate then decreases to $15.50/hr. for Internal Standard - $23.25/hr. for External Academic & Gov. - $31/hr. for External Int. Academic - $46.50/hr. for External Affiliated Commercial/Industrial - $62/hr. for External Commercial/Industrial.
    Runs not to exceed 24 hours in total.

    The Tescan MIRA3 scanning electron microscope rasters a focused energetic beam (probe) of electrons across a specimen surface. The interactions of the beam with the specimen are detected and then recorded as a function of probe position and used to generate two-dimensional images of the specimen. The signals that can be detected include secondary and backscattered electrons (for imaging), X-rays (for chemical analysis), and electron backscattered diffraction patterns (for structural analysis).

    Instrument Specifications:

  • Schottky field emission gun; 0.3 - 30 kV operating voltage
  • Everhart-Thornley and dedicated backscattered electron detectors; SE+BSE or BSE only imaging
  • EDAX Octane Pro (10 mm squared active area) SDD EDS
  • EDAX Hikari Plus CCD EBSD camera. FOR USE OF THE EBSD FOR MORE THAN 8 HOURS, PLEASE CONTACT THE NRF FOR LONG RUNS RATES
  • EDAX OIM Analysis 8 software

    • EDAX webinar: introduction to EBSD

    TRAINING REQUIREMENTS: Course EMA 6507 or Discussing with staff the content of the following reading material: Goldstein, J.I., Newbury, D.E., Echlin. P., Joy, D.C., Romig, A.D. Jr., Lyman, C.E., Fiori,C., and Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, A Text for Biologists, Materials Scientists, and Geologists. Third Edition. 2003. ISBN 0-306-47292-9 Chapters 2, 3 and 5. You will be directed to a quiz sign up link when requesting training for any of the SEM's.
Capabilities Training Prerequisites Calendar Contacts Docs
Contact LevelNameEmail
1Rudawski, Nicholasngr@ufl.edu
2Trucco, Andresandres5@ufl.edu
3Dempere, Luisa Ameliaademp@eng.ufl.edu

General Contact: nrfinfo@mail.ufl.edu

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