4 Point Probe Station - Status: Available
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The VEECO FPP-5000 4-point probe simplifies the measurement of resistive properties of
semiconductor wafers and resistive films. The microprocessor based electronics permits direct
computation of V/I, sheet or slice resistivity, and metallization thickness and P-N type testing.
Unlike most four point probes and probing stations, which move the probe head into the wafer,
the FPP-5000 is designed so that the wafer is moved into the probe head. This insures constant
probe force independent of operator force and wafer thickness. 4 pt probe wiki link |
Use Prerequisites
Prerequisite | Description | Status |
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Computer Access | Requires computer access be setup | Check Your Status |
Funding Source | Requires permission to an active funding source | Check Your Status |
Work Plan | Requires a work plan be approved by PI and staff | Check Your Status |
Agreement Form | Requires completed agreement form for equipment usage | Check Your Status |
NRF Safety Training | Requires completion of safety training | Check Your Status |
NRF Building Access | Requires issue of an id badge and entry badge and/or access level to be set. | Check Your Status |
Equipment Training | Requires completion of equipment training | Check Your Status |
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