4 Point Probe Station - Status: Available
  • Current Status: Available
  • Training: View Topics/Sessions
  • Use Rates:
    • External Academic & Government: $0.00/Hour
    • External Affiliated Commercial/Industrial: $0.00/Hour
    • External Commercial/Industrial: $0.00/Hour
    • External International Academic: $0.00/Hour
    • Internal Standard: $0.00/Hour
  • Service: Request Service Quote. The Staff rate is $50/hour (Internal) and $55 /hour (External) in addition to the instrument rate.
  • Building: NANO (0070)
  • Room: Microscopy Sample Prep (125)
  • In Cleanroom: No
  • Main Contact: Marco Downing
 The VEECO FPP-5000 4-point probe simplifies the measurement of resistive properties of semiconductor wafers and resistive films. The microprocessor based electronics permits direct computation of V/I, sheet or slice resistivity, and metallization thickness and P-N type testing. Unlike most four point probes and probing stations, which move the probe head into the wafer, the FPP-5000 is designed so that the wafer is moved into the probe head. This insures constant probe force independent of operator force and wafer thickness.

4 pt probe wiki link
Capabilities Training Prerequisites Calendar Contacts Docs
Contact LevelNameEmail
1Downing, Marcomadowning@ufl.edu
2Trucco, Andresandres5@ufl.edu

General Contact: nrfinfo@mail.ufl.edu

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