FIB/SEM - FEI Helios NanoLab 600i dual beam - Status: Available

Documents

TitleDownload Links
Application note - recipe for preparing TEM specimensDownload
FEI Helios Nanolab 600i dual FIB/SEM - basic SOP rev 2026_01Download
FIB ImageDownload
Helios - FEI manufacturer manualDownload
NFMCF user safety protocolsDownload
Publication on TEM specimen prep via FIB by Schaffer (2012)Download
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