FIB/SEM - FEI Helios NanoLab 600i dual beam - Status: Available
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The FEI Helios NanoLab 600i DualBeam system integrates focused ion and scanning electron beams for FIB and SEM functionality in one instrument.
Instrument Specifications: YouTube video demonstrating what is covered in basic training of the Helios YouTube video tutorial on use of the Helios to prepare lamellas Zoom workshop on dual beam FIB/SEM tips, tricks, and other useful info (recorded 11/19/21) EDAX webinar: introduction to EBSD TRAINING REQUIREMENTS: 1. Please create an NRF user account with a PI-approved funding source. 2. Please complete NRF general safety training. 3. Please complete the Radiation Safety Short Course AND obtain a dosimeter badge (regardless if you are working with radioactive or non-radioactive materials). 4. Please complete the FIB Knowledge Training course through eLearning; submit a training request using the "Training" link at the bottom of the page and follow the instructions to be added to the course; you must complete this course regardless of any prior coursework or operational experience related to SEM or FIB you may have. |
Contact Level | Name | |
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1 | Rudawski, Nicholas | ngr@ufl.edu |
2 | Trachet, Alison | aat425@ufl.edu |
General Contact: nrfinfo@mail.ufl.edu
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