Panalytical XPert MRD - Status: Available
|
Rate Notes: Published rates are for first 3 hours. Rate then decreases to $6.70/hr. for Internal Standard - $10/hr. for External Academic & Gov. - $13.40 External Int. Academic - $20/hr. for External Affiliated Commercial/Industrial - $26.75/hr. for External Commercial/Industrial.
X-ray crystallography is a technique in crystallography in which the pattern produced by the diffraction of x-rays through the closely spaced lattice of atoms in a crystal is recorded and then analyzed to reveal the nature of that lattice. This XRD is optimized for analysis of thin films and single crystal wafer materials. |
Materials Research Diffractometer (MRD):
system available for X-ray diffraction studies for:
- advanced materials science and nanotechnology
- metrologic characterization in semiconductor process development
It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:
- rocking curve analysis and reciprocal space mapping
- reflectometry and thin film phase analysis
- residual stress and texture analysis
Tube Anode type: Cu
Tube Power: 1800W
Goniometer Type: Four circle
Range: variable (based on scan axis and configuration)
Minimum step size: 0.01 – 0.0001 degrees (axis dependent)
Sample size, LOD, etc. are sample dependent.
Sample holder type: flat stage (motorized)
An active Gatorlink login is required to create a new reservation.